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This is technically a library function, but we use MMCs for testing, so it is easier to do it with DM. At the moment, the only block devices in sandbox are MMCs (AFAIK) so we just test with those. Signed-off-by: Sean Anderson <sean.anderson@seco.com>
76 lines
1.9 KiB
C
76 lines
1.9 KiB
C
// SPDX-License-Identifier: GPL-2.0+
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/*
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* Copyright (C) 2020 Sean Anderson <sean.anderson@seco.com>
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*/
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#include <common.h>
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#include <dm.h>
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#include <mmc.h>
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#include <part.h>
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#include <part_efi.h>
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#include <dm/test.h>
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#include <test/ut.h>
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static int dm_test_part(struct unit_test_state *uts)
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{
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char str_disk_guid[UUID_STR_LEN + 1];
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struct blk_desc *mmc_dev_desc;
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struct disk_partition part_info;
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struct disk_partition parts[2] = {
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{
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.start = 48, /* GPT data takes up the first 34 blocks or so */
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.size = 1,
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.name = "test1",
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},
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{
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.start = 49,
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.size = 1,
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.name = "test2",
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},
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};
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ut_asserteq(1, blk_get_device_by_str("mmc", "1", &mmc_dev_desc));
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if (CONFIG_IS_ENABLED(RANDOM_UUID)) {
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gen_rand_uuid_str(parts[0].uuid, UUID_STR_FORMAT_STD);
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gen_rand_uuid_str(parts[1].uuid, UUID_STR_FORMAT_STD);
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gen_rand_uuid_str(str_disk_guid, UUID_STR_FORMAT_STD);
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}
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ut_assertok(gpt_restore(mmc_dev_desc, str_disk_guid, parts,
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ARRAY_SIZE(parts)));
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#define test(expected, part_str, whole) \
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ut_asserteq(expected, \
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part_get_info_by_dev_and_name_or_num("mmc", part_str, \
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&mmc_dev_desc, \
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&part_info, whole))
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test(-ENODEV, "", true);
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env_set("bootdevice", "0");
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test(0, "", true);
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env_set("bootdevice", "1");
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test(1, "", false);
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test(1, "-", false);
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env_set("bootdevice", "");
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test(-EPROTONOSUPPORT, "0", false);
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test(0, "0", true);
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test(0, ":0", true);
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test(0, ".0", true);
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test(0, ".0:0", true);
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test(-EINVAL, "#test1", true);
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test(1, "1", false);
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test(1, "1", true);
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test(-ENOENT, "1:0", false);
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test(0, "1:0", true);
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test(1, "1:1", false);
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test(2, "1:2", false);
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test(1, "1.0", false);
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test(0, "1.0:0", true);
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test(1, "1.0:1", false);
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test(2, "1.0:2", false);
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test(-EINVAL, "1#bogus", false);
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test(1, "1#test1", false);
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test(2, "1#test2", false);
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return 0;
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}
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DM_TEST(dm_test_part, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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