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b073d48e8d
Most tests don't have this. It helps to keep the test declaration clearly associated with the function it relates to, rather than the next one in the file. Remove the extra blank line and mention this in the docs. Signed-off-by: Simon Glass <sjg@chromium.org>
39 lines
1 KiB
C
39 lines
1 KiB
C
// SPDX-License-Identifier: GPL-2.0+ OR BSD-3-Clause
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/*
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* Copyright (C) 2018, STMicroelectronics - All Rights Reserved
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*/
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#include <dm.h>
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#include <hwspinlock.h>
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#include <asm/state.h>
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#include <asm/test.h>
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#include <dm/test.h>
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#include <test/test.h>
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#include <test/ut.h>
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/* Test that hwspinlock driver functions are called */
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static int dm_test_hwspinlock_base(struct unit_test_state *uts)
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{
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struct sandbox_state *state = state_get_current();
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struct hwspinlock hws;
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ut_assertok(uclass_get_device(UCLASS_HWSPINLOCK, 0, &hws.dev));
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ut_assertnonnull(hws.dev);
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ut_asserteq(false, state->hwspinlock);
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hws.id = 0;
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ut_assertok(hwspinlock_lock_timeout(&hws, 1));
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ut_asserteq(true, state->hwspinlock);
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ut_assertok(hwspinlock_unlock(&hws));
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ut_asserteq(false, state->hwspinlock);
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ut_assertok(hwspinlock_lock_timeout(&hws, 1));
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ut_assertok(!hwspinlock_lock_timeout(&hws, 1));
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ut_assertok(hwspinlock_unlock(&hws));
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ut_assertok(!hwspinlock_unlock(&hws));
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return 0;
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}
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DM_TEST(dm_test_hwspinlock_base, UTF_SCAN_PDATA | UTF_SCAN_FDT);
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