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Re-factoring the legacy NAND code (legacy NAND now only in board-specific
code and in SoC code). Boards using the old way have CFG_NAND_LEGACY and BOARDLIBS = drivers/nand_legacy/libnand_legacy.a added. Build breakage for NETTA.ERR and NETTA_ISDN - will go away when the new NAND support is implemented for these boards.
This commit is contained in:
parent
038ccac511
commit
addb2e1650
86 changed files with 2881 additions and 2712 deletions
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@ -2,10 +2,10 @@
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* linux/include/linux/mtd/nand.h
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*
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* Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
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* Steven J. Hill <sjhill@cotw.com>
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* Thomas Gleixner <gleixner@autronix.de>
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* Steven J. Hill <sjhill@realitydiluted.com>
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* Thomas Gleixner <tglx@linutronix.de>
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*
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* $Id: nand.h,v 1.7 2003/07/24 23:30:46 a0384864 Exp $
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* $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License version 2 as
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@ -32,13 +32,66 @@
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* command delay times for different chips
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* 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate
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* defines in jffs2/wbuf.c
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* 08-07-2002 TG forced bad block location to byte 5 of OOB, even if
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* CONFIG_MTD_NAND_ECC_JFFS2 is not set
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* 08-10-2002 TG extensions to nand_chip structure to support HW-ECC
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*
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* 08-29-2002 tglx nand_chip structure: data_poi for selecting
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* internal / fs-driver buffer
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* support for 6byte/512byte hardware ECC
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* read_ecc, write_ecc extended for different oob-layout
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* oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
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* NAND_YAFFS_OOB
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* 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
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* Split manufacturer and device ID structures
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*
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* 02-08-2004 tglx added option field to nand structure for chip anomalities
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* 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
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* update of nand_chip structure description
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*/
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#ifndef __LINUX_MTD_NAND_H
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#define __LINUX_MTD_NAND_H
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#ifdef CONFIG_NEW_NAND_CODE
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#include "nand_new.h"
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#else
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#include <linux/mtd/compat.h>
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#include <linux/mtd/mtd.h>
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struct mtd_info;
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/* Scan and identify a NAND device */
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extern int nand_scan (struct mtd_info *mtd, int max_chips);
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/* Free resources held by the NAND device */
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extern void nand_release (struct mtd_info *mtd);
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/* Read raw data from the device without ECC */
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extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
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/* This constant declares the max. oobsize / page, which
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* is supported now. If you add a chip with bigger oobsize/page
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* adjust this accordingly.
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*/
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#define NAND_MAX_OOBSIZE 64
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/*
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* Constants for hardware specific CLE/ALE/NCE function
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*/
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/* Select the chip by setting nCE to low */
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#define NAND_CTL_SETNCE 1
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/* Deselect the chip by setting nCE to high */
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#define NAND_CTL_CLRNCE 2
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/* Select the command latch by setting CLE to high */
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#define NAND_CTL_SETCLE 3
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/* Deselect the command latch by setting CLE to low */
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#define NAND_CTL_CLRCLE 4
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/* Select the address latch by setting ALE to high */
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#define NAND_CTL_SETALE 5
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/* Deselect the address latch by setting ALE to low */
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#define NAND_CTL_CLRALE 6
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/* Set write protection by setting WP to high. Not used! */
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#define NAND_CTL_SETWP 7
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/* Clear write protection by setting WP to low. Not used! */
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#define NAND_CTL_CLRWP 8
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/*
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* Standard NAND flash commands
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*/
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#define NAND_CMD_READOOB 0x50
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#define NAND_CMD_ERASE1 0x60
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#define NAND_CMD_STATUS 0x70
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#define NAND_CMD_STATUS_MULTI 0x71
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#define NAND_CMD_SEQIN 0x80
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#define NAND_CMD_READID 0x90
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#define NAND_CMD_ERASE2 0xd0
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#define NAND_CMD_RESET 0xff
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/* Extended commands for large page devices */
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#define NAND_CMD_READSTART 0x30
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#define NAND_CMD_CACHEDPROG 0x15
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/* Status bits */
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#define NAND_STATUS_FAIL 0x01
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#define NAND_STATUS_FAIL_N1 0x02
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#define NAND_STATUS_TRUE_READY 0x20
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#define NAND_STATUS_READY 0x40
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#define NAND_STATUS_WP 0x80
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/*
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* Constants for ECC_MODES
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*/
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/* No ECC. Usage is not recommended ! */
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#define NAND_ECC_NONE 0
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/* Software ECC 3 byte ECC per 256 Byte data */
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#define NAND_ECC_SOFT 1
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/* Hardware ECC 3 byte ECC per 256 Byte data */
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#define NAND_ECC_HW3_256 2
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/* Hardware ECC 3 byte ECC per 512 Byte data */
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#define NAND_ECC_HW3_512 3
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/* Hardware ECC 3 byte ECC per 512 Byte data */
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#define NAND_ECC_HW6_512 4
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/* Hardware ECC 8 byte ECC per 512 Byte data */
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#define NAND_ECC_HW8_512 6
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/* Hardware ECC 12 byte ECC per 2048 Byte data */
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#define NAND_ECC_HW12_2048 7
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/*
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* Constants for Hardware ECC
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*/
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/* Reset Hardware ECC for read */
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#define NAND_ECC_READ 0
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/* Reset Hardware ECC for write */
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#define NAND_ECC_WRITE 1
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/* Enable Hardware ECC before syndrom is read back from flash */
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#define NAND_ECC_READSYN 2
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/* Option constants for bizarre disfunctionality and real
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* features
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*/
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/* Chip can not auto increment pages */
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#define NAND_NO_AUTOINCR 0x00000001
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/* Buswitdh is 16 bit */
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#define NAND_BUSWIDTH_16 0x00000002
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/* Device supports partial programming without padding */
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#define NAND_NO_PADDING 0x00000004
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/* Chip has cache program function */
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#define NAND_CACHEPRG 0x00000008
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/* Chip has copy back function */
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#define NAND_COPYBACK 0x00000010
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/* AND Chip which has 4 banks and a confusing page / block
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* assignment. See Renesas datasheet for further information */
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#define NAND_IS_AND 0x00000020
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/* Chip has a array of 4 pages which can be read without
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* additional ready /busy waits */
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#define NAND_4PAGE_ARRAY 0x00000040
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/* Options valid for Samsung large page devices */
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#define NAND_SAMSUNG_LP_OPTIONS \
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(NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
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/* Macros to identify the above */
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#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
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#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
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#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
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#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
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/* Mask to zero out the chip options, which come from the id table */
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#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
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/* Non chip related options */
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/* Use a flash based bad block table. This option is passed to the
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* default bad block table function. */
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#define NAND_USE_FLASH_BBT 0x00010000
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/* The hw ecc generator provides a syndrome instead a ecc value on read
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* This can only work if we have the ecc bytes directly behind the
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* data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
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#define NAND_HWECC_SYNDROME 0x00020000
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/* Options set by nand scan */
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/* Nand scan has allocated oob_buf */
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#define NAND_OOBBUF_ALLOC 0x40000000
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/* Nand scan has allocated data_buf */
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#define NAND_DATABUF_ALLOC 0x80000000
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/*
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* nand_state_t - chip states
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* Enumeration for NAND flash chip state
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*/
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typedef enum {
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FL_READING,
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FL_WRITING,
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FL_ERASING,
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FL_SYNCING
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FL_SYNCING,
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FL_CACHEDPRG,
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} nand_state_t;
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/* Keep gcc happy */
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struct nand_chip;
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/*
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* NAND Private Flash Chip Data
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*
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* Structure overview:
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*
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* IO_ADDR - address to access the 8 I/O lines of the flash device
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*
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* hwcontrol - hardwarespecific function for accesing control-lines
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*
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* dev_ready - hardwarespecific function for accesing device ready/busy line
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*
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* chip_lock - spinlock used to protect access to this structure
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*
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* wq - wait queue to sleep on if a NAND operation is in progress
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*
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* state - give the current state of the NAND device
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*
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* page_shift - number of address bits in a page (column address bits)
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*
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* data_buf - data buffer passed to/from MTD user modules
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*
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* data_cache - data cache for redundant page access and shadow for
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* ECC failure
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*
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* ecc_code_buf - used only for holding calculated or read ECCs for
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* a page read or written when ECC is in use
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*
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* reserved - padding to make structure fall on word boundary if
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* when ECC is in use
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#if 0
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/**
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* struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
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* @lock: protection lock
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* @active: the mtd device which holds the controller currently
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*/
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struct Nand {
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char floor, chip;
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unsigned long curadr;
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unsigned char curmode;
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/* Also some erase/write/pipeline info when we get that far */
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struct nand_hw_control {
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spinlock_t lock;
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struct nand_chip *active;
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};
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#endif
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/**
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* struct nand_chip - NAND Private Flash Chip Data
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* @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
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* @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
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* @read_byte: [REPLACEABLE] read one byte from the chip
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* @write_byte: [REPLACEABLE] write one byte to the chip
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* @read_word: [REPLACEABLE] read one word from the chip
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* @write_word: [REPLACEABLE] write one word to the chip
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* @write_buf: [REPLACEABLE] write data from the buffer to the chip
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* @read_buf: [REPLACEABLE] read data from the chip into the buffer
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* @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
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* @select_chip: [REPLACEABLE] select chip nr
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* @block_bad: [REPLACEABLE] check, if the block is bad
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* @block_markbad: [REPLACEABLE] mark the block bad
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* @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
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* @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
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* If set to NULL no access to ready/busy is available and the ready/busy information
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* is read from the chip status register
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* @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
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* @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
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* @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
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* @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
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* @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
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* be provided if a hardware ECC is available
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* @erase_cmd: [INTERN] erase command write function, selectable due to AND support
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* @scan_bbt: [REPLACEABLE] function to scan bad block table
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* @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
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* @eccsize: [INTERN] databytes used per ecc-calculation
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* @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step
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* @eccsteps: [INTERN] number of ecc calculation steps per page
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* @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
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* @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip
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* @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
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* @state: [INTERN] the current state of the NAND device
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* @page_shift: [INTERN] number of address bits in a page (column address bits)
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* @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
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* @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
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* @chip_shift: [INTERN] number of address bits in one chip
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* @data_buf: [INTERN] internal buffer for one page + oob
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* @oob_buf: [INTERN] oob buffer for one eraseblock
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* @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
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* @data_poi: [INTERN] pointer to a data buffer
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* @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
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* special functionality. See the defines for further explanation
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* @badblockpos: [INTERN] position of the bad block marker in the oob area
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* @numchips: [INTERN] number of physical chips
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* @chipsize: [INTERN] the size of one chip for multichip arrays
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* @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
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* @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
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* @autooob: [REPLACEABLE] the default (auto)placement scheme
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* @bbt: [INTERN] bad block table pointer
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* @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
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* @bbt_md: [REPLACEABLE] bad block table mirror descriptor
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* @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
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* @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
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* @priv: [OPTIONAL] pointer to private chip date
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*/
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struct nand_chip {
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void __iomem *IO_ADDR_R;
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void __iomem *IO_ADDR_W;
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u_char (*read_byte)(struct mtd_info *mtd);
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void (*write_byte)(struct mtd_info *mtd, u_char byte);
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u16 (*read_word)(struct mtd_info *mtd);
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void (*write_word)(struct mtd_info *mtd, u16 word);
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void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
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void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
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int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
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void (*select_chip)(struct mtd_info *mtd, int chip);
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int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
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int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
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void (*hwcontrol)(struct mtd_info *mtd, int cmd);
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int (*dev_ready)(struct mtd_info *mtd);
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void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
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int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
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int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
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int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
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void (*enable_hwecc)(struct mtd_info *mtd, int mode);
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void (*erase_cmd)(struct mtd_info *mtd, int page);
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int (*scan_bbt)(struct mtd_info *mtd);
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int eccmode;
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int eccsize;
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int eccbytes;
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int eccsteps;
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int chip_delay;
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#if 0
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spinlock_t chip_lock;
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wait_queue_head_t wq;
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nand_state_t state;
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#endif
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int page_shift;
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int phys_erase_shift;
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int bbt_erase_shift;
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int chip_shift;
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u_char *data_buf;
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u_char *data_cache;
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int cache_page;
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u_char ecc_code_buf[6];
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u_char reserved[2];
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char ChipID; /* Type of DiskOnChip */
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struct Nand *chips;
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int chipshift;
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char* chips_name;
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unsigned long erasesize;
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unsigned long mfr; /* Flash IDs - only one type of flash per device */
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unsigned long id;
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char* name;
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int numchips;
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char page256;
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char pageadrlen;
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unsigned long IO_ADDR; /* address to access the 8 I/O lines to the flash device */
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unsigned long totlen;
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uint oobblock; /* Size of OOB blocks (e.g. 512) */
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uint oobsize; /* Amount of OOB data per block (e.g. 16) */
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uint eccsize;
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int bus16;
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u_char *oob_buf;
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int oobdirty;
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u_char *data_poi;
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unsigned int options;
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int badblockpos;
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int numchips;
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unsigned long chipsize;
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int pagemask;
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int pagebuf;
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struct nand_oobinfo *autooob;
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uint8_t *bbt;
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struct nand_bbt_descr *bbt_td;
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struct nand_bbt_descr *bbt_md;
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struct nand_bbt_descr *badblock_pattern;
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struct nand_hw_control *controller;
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void *priv;
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};
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/*
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@ -133,71 +345,125 @@ struct nand_chip {
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*/
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#define NAND_MFR_TOSHIBA 0x98
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#define NAND_MFR_SAMSUNG 0xec
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#define NAND_MFR_FUJITSU 0x04
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#define NAND_MFR_NATIONAL 0x8f
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#define NAND_MFR_RENESAS 0x07
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#define NAND_MFR_STMICRO 0x20
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/*
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* NAND Flash Device ID Structure
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/**
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* struct nand_flash_dev - NAND Flash Device ID Structure
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*
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* Structure overview:
|
||||
*
|
||||
* name - Complete name of device
|
||||
*
|
||||
* manufacture_id - manufacturer ID code of device.
|
||||
*
|
||||
* model_id - model ID code of device.
|
||||
*
|
||||
* chipshift - total number of address bits for the device which
|
||||
* is used to calculate address offsets and the total
|
||||
* number of bytes the device is capable of.
|
||||
*
|
||||
* page256 - denotes if flash device has 256 byte pages or not.
|
||||
*
|
||||
* pageadrlen - number of bytes minus one needed to hold the
|
||||
* complete address into the flash array. Keep in
|
||||
* mind that when a read or write is done to a
|
||||
* specific address, the address is input serially
|
||||
* 8 bits at a time. This structure member is used
|
||||
* by the read/write routines as a loop index for
|
||||
* shifting the address out 8 bits at a time.
|
||||
*
|
||||
* erasesize - size of an erase block in the flash device.
|
||||
* @name: Identify the device type
|
||||
* @id: device ID code
|
||||
* @pagesize: Pagesize in bytes. Either 256 or 512 or 0
|
||||
* If the pagesize is 0, then the real pagesize
|
||||
* and the eraseize are determined from the
|
||||
* extended id bytes in the chip
|
||||
* @erasesize: Size of an erase block in the flash device.
|
||||
* @chipsize: Total chipsize in Mega Bytes
|
||||
* @options: Bitfield to store chip relevant options
|
||||
*/
|
||||
struct nand_flash_dev {
|
||||
char * name;
|
||||
int manufacture_id;
|
||||
int model_id;
|
||||
int chipshift;
|
||||
char page256;
|
||||
char pageadrlen;
|
||||
char *name;
|
||||
int id;
|
||||
unsigned long pagesize;
|
||||
unsigned long chipsize;
|
||||
unsigned long erasesize;
|
||||
int bus16;
|
||||
unsigned long options;
|
||||
};
|
||||
|
||||
/**
|
||||
* struct nand_manufacturers - NAND Flash Manufacturer ID Structure
|
||||
* @name: Manufacturer name
|
||||
* @id: manufacturer ID code of device.
|
||||
*/
|
||||
struct nand_manufacturers {
|
||||
int id;
|
||||
char * name;
|
||||
};
|
||||
|
||||
extern struct nand_flash_dev nand_flash_ids[];
|
||||
extern struct nand_manufacturers nand_manuf_ids[];
|
||||
|
||||
/**
|
||||
* struct nand_bbt_descr - bad block table descriptor
|
||||
* @options: options for this descriptor
|
||||
* @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
|
||||
* when bbt is searched, then we store the found bbts pages here.
|
||||
* Its an array and supports up to 8 chips now
|
||||
* @offs: offset of the pattern in the oob area of the page
|
||||
* @veroffs: offset of the bbt version counter in the oob are of the page
|
||||
* @version: version read from the bbt page during scan
|
||||
* @len: length of the pattern, if 0 no pattern check is performed
|
||||
* @maxblocks: maximum number of blocks to search for a bbt. This number of
|
||||
* blocks is reserved at the end of the device where the tables are
|
||||
* written.
|
||||
* @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
|
||||
* bad) block in the stored bbt
|
||||
* @pattern: pattern to identify bad block table or factory marked good /
|
||||
* bad blocks, can be NULL, if len = 0
|
||||
*
|
||||
* Descriptor for the bad block table marker and the descriptor for the
|
||||
* pattern which identifies good and bad blocks. The assumption is made
|
||||
* that the pattern and the version count are always located in the oob area
|
||||
* of the first block.
|
||||
*/
|
||||
struct nand_bbt_descr {
|
||||
int options;
|
||||
int pages[NAND_MAX_CHIPS];
|
||||
int offs;
|
||||
int veroffs;
|
||||
uint8_t version[NAND_MAX_CHIPS];
|
||||
int len;
|
||||
int maxblocks;
|
||||
int reserved_block_code;
|
||||
uint8_t *pattern;
|
||||
};
|
||||
|
||||
/* Options for the bad block table descriptors */
|
||||
|
||||
/* The number of bits used per block in the bbt on the device */
|
||||
#define NAND_BBT_NRBITS_MSK 0x0000000F
|
||||
#define NAND_BBT_1BIT 0x00000001
|
||||
#define NAND_BBT_2BIT 0x00000002
|
||||
#define NAND_BBT_4BIT 0x00000004
|
||||
#define NAND_BBT_8BIT 0x00000008
|
||||
/* The bad block table is in the last good block of the device */
|
||||
#define NAND_BBT_LASTBLOCK 0x00000010
|
||||
/* The bbt is at the given page, else we must scan for the bbt */
|
||||
#define NAND_BBT_ABSPAGE 0x00000020
|
||||
/* The bbt is at the given page, else we must scan for the bbt */
|
||||
#define NAND_BBT_SEARCH 0x00000040
|
||||
/* bbt is stored per chip on multichip devices */
|
||||
#define NAND_BBT_PERCHIP 0x00000080
|
||||
/* bbt has a version counter at offset veroffs */
|
||||
#define NAND_BBT_VERSION 0x00000100
|
||||
/* Create a bbt if none axists */
|
||||
#define NAND_BBT_CREATE 0x00000200
|
||||
/* Search good / bad pattern through all pages of a block */
|
||||
#define NAND_BBT_SCANALLPAGES 0x00000400
|
||||
/* Scan block empty during good / bad block scan */
|
||||
#define NAND_BBT_SCANEMPTY 0x00000800
|
||||
/* Write bbt if neccecary */
|
||||
#define NAND_BBT_WRITE 0x00001000
|
||||
/* Read and write back block contents when writing bbt */
|
||||
#define NAND_BBT_SAVECONTENT 0x00002000
|
||||
/* Search good / bad pattern on the first and the second page */
|
||||
#define NAND_BBT_SCAN2NDPAGE 0x00004000
|
||||
|
||||
/* The maximum number of blocks to scan for a bbt */
|
||||
#define NAND_BBT_SCAN_MAXBLOCKS 4
|
||||
|
||||
extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
|
||||
extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
|
||||
extern int nand_default_bbt (struct mtd_info *mtd);
|
||||
extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
|
||||
extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
|
||||
|
||||
/*
|
||||
* Constants for oob configuration
|
||||
*/
|
||||
#define NAND_NOOB_ECCPOS0 0
|
||||
#define NAND_NOOB_ECCPOS1 1
|
||||
#define NAND_NOOB_ECCPOS2 2
|
||||
#define NAND_NOOB_ECCPOS3 3
|
||||
#define NAND_NOOB_ECCPOS4 6
|
||||
#define NAND_NOOB_ECCPOS5 7
|
||||
#define NAND_NOOB_BADBPOS -1
|
||||
#define NAND_NOOB_ECCVPOS -1
|
||||
#define NAND_SMALL_BADBLOCK_POS 5
|
||||
#define NAND_LARGE_BADBLOCK_POS 0
|
||||
|
||||
#define NAND_JFFS2_OOB_ECCPOS0 0
|
||||
#define NAND_JFFS2_OOB_ECCPOS1 1
|
||||
#define NAND_JFFS2_OOB_ECCPOS2 2
|
||||
#define NAND_JFFS2_OOB_ECCPOS3 3
|
||||
#define NAND_JFFS2_OOB_ECCPOS4 6
|
||||
#define NAND_JFFS2_OOB_ECCPOS5 7
|
||||
#define NAND_JFFS2_OOB_BADBPOS 5
|
||||
#define NAND_JFFS2_OOB_ECCVPOS 4
|
||||
|
||||
#define NAND_JFFS2_OOB8_FSDAPOS 6
|
||||
#define NAND_JFFS2_OOB16_FSDAPOS 8
|
||||
#define NAND_JFFS2_OOB8_FSDALEN 2
|
||||
#define NAND_JFFS2_OOB16_FSDALEN 8
|
||||
|
||||
unsigned long nand_probe(unsigned long physadr);
|
||||
#endif /* !CONFIG_NEW_NAND_CODE */
|
||||
#endif /* __LINUX_MTD_NAND_H */
|
||||
|
|
Loading…
Add table
Add a link
Reference in a new issue