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refactor(fdt-wrappers): fix for unit testing errors
As the unit testing project uses the host machine GCC version to compile, it is marking non-casted references as errors. This patch adds the proper casting, so it compiles correctly for both Arm platforms and host machines for unit testing. Change-Id: Iee96e9117301ba28b6f164aac2cd36dc0f8b6be8 Signed-off-by: Juan Pablo Conde <juanpablo.conde@arm.com>
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1 changed files with 4 additions and 3 deletions
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@ -1,5 +1,5 @@
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/*
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* Copyright (c) 2018-2022, ARM Limited and Contributors. All rights reserved.
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* Copyright (c) 2018-2023, Arm Limited and Contributors. All rights reserved.
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*
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* SPDX-License-Identifier: BSD-3-Clause
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*/
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@ -49,7 +49,7 @@ int fdtw_find_or_add_subnode(void *fdt, int parentoffset, const char *name);
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static inline uint32_t fdt_blob_size(const void *dtb)
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{
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const uint32_t *dtb_header = dtb;
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const uint32_t *dtb_header = (const uint32_t *)dtb;
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return fdt32_to_cpu(dtb_header[1]);
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}
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@ -60,7 +60,8 @@ static inline bool fdt_node_is_enabled(const void *fdt, int node)
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const void *prop = fdt_getprop(fdt, node, "status", &len);
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/* A non-existing status property means the device is enabled. */
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return (prop == NULL) || (len == 5 && strcmp(prop, "okay") == 0);
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return (prop == NULL) || (len == 5 && strcmp((const char *)prop,
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"okay") == 0);
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}
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#define fdt_for_each_compatible_node(dtb, node, compatible_str) \
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